The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 1999
Filed:
Nov. 07, 1997
Suzhou Huang, Cambridge, MA (US);
Michael V Hynes, Lincoln, MA (US);
American Science and Engineering, Inc., Billerica, MA (US);
Abstract
An X-ray imaging system which measures X-rays scattered by material concealed within an enveloping surface. A beam of X-ray radiation is incident on the enveloping surface and scattered onto one or more arrays of detectors. One or more masks of material opaque to X-ray transmission but for a series of apertures is interposed between the object and the detectors so as to cast shadows on different parts of the detector array. The image of the scattering material, as detected at the detector array, is modulated by the pattern of mask apertures. A controller reconstructs the image of the illuminated line. By scanning the illumination with respect to the object, an image of the entire object in scattered radiation is obtained, while use of multiple arrays or variation of geometrical settings allows reconstruction of the source of scattering in three dimensions.