The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 1999
Filed:
Jul. 28, 1997
Iwao Sakai, Tokyo, JP;
Naoyuki Sinonaga, Tokyo, JP;
Sinji Senba, Tokyo, JP;
Mamoru Miyamoto, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A semiconductor device test system includes a first warehouse, an insertion and extraction unit, a second warehouse, a test burn-in unit, and a scheduler. The scheduler sets a test schedule so that the test burn-in unit tests the semiconductor devices according to the type of semiconductor devices, based on product data transmitted from the first and second warehouses. The scheduler issues an instruction to transfer a desired burn-in board from the second warehouse to the insertion and extraction unit based on the insertion and extraction schedule. The scheduler issues an instruction to transfer the desired burn-in board from the insertion and extraction unit to the second warehouse based on the insertion and extraction schedule. A high throughput test system is thus provided that concurrently carries out the insertion and extraction of semiconductor devices with respect to burn-in boards.