The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 1999

Filed:

Mar. 17, 1997
Applicant:
Inventors:

Jimmie D Felps, Colorado Springs, CO (US);

Brian L Richardson, Colorado Springs, CO (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B / ;
U.S. Cl.
CPC ...
324115 ; 324601 ; 324 725 ; 324 731 ;
Abstract

An interface having nine connections between a probe and test and measurement equipment includes a fixed voltage source located in the test and measurement equipment, which delivers through a first connection a positive fixed voltage, and through a second connection a negative fixed voltage. A voltage-programming resistor located in the probe produces a signal that is delivered from the probe through one of the connections to the equipment to control a programmed voltage source. The programmed voltage is delivered as a positive programmed voltage through one pin and as a negative programmed voltage through a second connection. A probe identification resistor is located in the probe. An ohmmeter in the equipment measures the resistance of the probe identification resistor through one of the connections. This identity is delivered into the equipment so that the equipment, by accessing an internal look-up table, can obtain the probe's characteristics to configure the equipment for the circuit requirements of the probe. A two-way communication path between the probe and the test and measurement equipment is provided through two of the connections. An offset current is provided in the equipment and is delivered through one connection to the probe.


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