The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 1999

Filed:

Jul. 28, 1997
Applicant:
Inventors:

Noriyuki Yamada, Tokyo, JP;

Kenichi Sakata, Tokyo, JP;

Shigeru Nawa, Tokyo, JP;

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250288 ; 250292 ;
Abstract

An inductively coupled plasma mass spectroscopic includes a sample introduction section for nebulizing a sample solution; an ionization section, including a torch, for ionizing a nebula of a sample solution that is carried with a carrier gas; an interface section for sampling the ionized elements in the nebula at an atmospheric pressure and directing ions of the ionized elements into an ion lens section under a vacuum; the ion lens portion, containing an ion beam guide, for converging the ions which have passed through the interface section wherein at least one part of the ion lens portion is a multipole ion beam guide with at least four electrode rods; a mass selection portion, having a mass filter, for filtering the ions based on the measured mass number; and a detection section for counting filtered ions.


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