The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 1999

Filed:

Apr. 29, 1996
Applicant:
Inventor:

Glenn Steven Spitz, Northport, NY (US);

Assignee:

Webscan, Inc., Brentwood, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
235462 ; 235486 ;
Abstract

An evaluation system having one or more scanner units providing arrangements to enable the computer controlled, rapid setup and calibration of each included scanner unit to be employed for evaluation. The calibration is effected with specific settings established using stored calibration parameter groups. The calibration parameter groups, which are previously determined using special calibration targets, are stored and available for later recall and use, as needed. The evaluation system arrangements provide for slidably mounted scanner units to enable the distance between the scanner unit and a target indicia to be adjusted to a known distance to produce a selected spot size for the subsequent evaluations. A computing unit is provided having a memory to store the plurality of calibration parameter groups, with each stored calibration parameter group available to provide parameter values to be applied for use with the included scanner units.


Find Patent Forward Citations

Loading…