The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 1999
Filed:
Jun. 12, 1997
Hans Ulrich Meyer, Morges, CH;
Daniel Clerc, Crissier, CH;
Sylvac SA, Crissier, CH;
Abstract
A measuring instrument comprises a column (10) on which is mounted a carriage (11) with a drive cursor (12) and a measuring cursor (20) sliding on the drive cursor (12) and carrying a measuring contact (24) and a measuring device (40). A measuring force device (25) is arranged between the two cursors and determines, thanks to a lever (26) a rest position and two measuring positions vertically upwardly or downwardly offset or corresponding to a predetermined measuring force on the member to be measured. A motor (15) displaces the drive cursor (12) and the position detector (36) permits measuring the relative position between the two cursors. A control unit (35) controls the speed and direction of rotation of the motor (15) as a function either of the signals (44) received from the position detector (36) or from two external contacts (42, 43). The carriage (11) is first displaced by means of the external contacts (42, 43) and as soon as the lag between the two cursors reaches an upper or lower limit, the control of the motor is effected as a function of the signals received from the position detector (36). There is thus obtained a double subjection of the speed of movement of the carriage and of the measuring force, permitting very precise and rapid measurements and rendering easy the measurement of profiles.