The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 1999
Filed:
Nov. 04, 1997
Horst Eckardt, Munich, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
Memory modules contain most of the transistors in a computer and thus constitute the most important components to be tested. In order, for example, to monitor the function of memory chips in applications which are critical for safety, it is necessary to carry out memory tests during ongoing operation of a computer. Furthermore, it is appropriate to make these memory tests possible under real-time conditions so that the application program can run without degradation. Highly effective memory tests enable stuck-at faults, connection faults and pattern-sensitive faults to be detected. In the method, the highly effective memory test is performed during ongoing operation of a computer while maintaining real-time conditions by dividing testing into a suitable combination of Franklin tests, which discover pattern-sensitive faults of adjacent memory cells, and of Nair tests, which discover connection faults in the incoming lines.