The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 1999

Filed:

Oct. 29, 1997
Applicant:
Inventors:

Roy Yu, Poughkeepsie, NY (US);

Gerald K Bartley, Rochester, MN (US);

Peter A Franklin, Marlboro, NY (US);

Carmine J Mele, Gardiner, NY (US);

Arthur G Merryman, Hopewell Junction, NY (US);

John R Pennacchia, Wappingers Falls, NY (US);

Kurt A Smith, Poughkeepsie, NY (US);

Thomas A Wassick, Lagrangeville, NY (US);

Thomas A Wayson, Owego, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438-4 ; 438 15 ; 438 17 ; 438 18 ;
Abstract

A Process for graphically assisting the partial repair of defective MCM TF wiring nets. The process comprises the steps of inserting the wiring layer of the thin-film device in a tester, scanning the wiring layer of the thin-film device with the tester, identifying defects in the wiring nets, prioritizing the defects based on a function of each of the defective wiring nets, and repairing the defects based on priority.


Find Patent Forward Citations

Loading…