The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 1999
Filed:
Jul. 25, 1997
Franklyn H Story, Chandler, AZ (US);
Koichi Eugene Nomura, Phoenix, AZ (US);
Michael James Fickes, Tempe, AZ (US);
VLSI Technology, Inc., San Jose, CA (US);
Abstract
A testing apparatus and method are for testing a plurality of logic blocks within an integrated circuit. The integrated circuit includes a test data input bus, a test data output bus coupled to the output of each logic block, and test enable means which includes selection means coupled between the plurality of logic blocks and the test data input bus. The test enable means selects a first logic block from the plurality of logic blocks, and the selection means selectively inputs to each logic block either normal operating input or the test data. The test results are received from the first logic block through the test data output bus.