The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 1999
Filed:
Sep. 01, 1998
Weiping Wang, Schenectady, NY (US);
Thomas Huei Hwang, Schenectady, NY (US);
Emily Yixie Shu, Niskayuna, NY (US);
Richard Alan Ridilla, Hudson, NH (US);
Michael Evans Graham, Slingerlands, NY (US);
Michael Kent Cueman, Niskayuna, NY (US);
Meng-Ling Hsiao, Schenectady, NY (US);
Charles Richard Evans, Cincinnati, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for detecting misalignment of initially-aligned fiber filaments in a composite. An optical fiber is placed among the fiber filaments in the composite, light is directed into the optical fiber, the intensity of the light in the optical fiber is measured during subsequent composite processing, and attenuation in such light intensity is ascertained which indicates such misalignment (e.g., wrinkling, bending, buckling, porosity, delamination and the like) is being detected during such processing. In another preferred method, before-processing and after-processing x-ray images are taken of an x-ray-attenuating fiber which has been placed among x-ray-transparent fiber filaments in a composite.