The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 1999
Filed:
Aug. 20, 1998
Akinari Takagi, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
Disclosed herein is an ophthalmic instrument equipped with an optical alignment system. The optical alignment system has a Z-alignment index projection light system (60) which projects index light onto the cornea (C) of a subject eye (E) and a sensor (73) which receives reflected light of the index light reflected at the cornea (C). The ophthalmic instrument is further equipped with a Z-alignment detection circuit (74) which computes a positional relation between an index image formed on a light receiving surface of the sensor (73) and the cornea (C). When the result of computation by the detection circuit (74) is within a predetermined range, the subject eye is measured. The Z-alignment index projection light system (60) is provided with an aperture diaphragm (63) which has a transmittance distribution characteristic in which a quantity of light is gradually reduced from the optical axis of the system (60) in a radial direction.