The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 1999
Filed:
Oct. 06, 1997
Larry Y Mo, Waukesha, WI (US);
David D Becker, Milwaukee, WI (US);
Kevin McCann, Raleigh, NC (US);
Masayoshi Honda, Tokyo, JP;
Shinichi Ishiguro, Tokyo, JP;
General Electric Company, Milwaukee, WI (US);
Abstract
An analytical method for automatic tracing of a Doppler time-velocity waveform envelope. At the core of this algorithm is a maximum frequency detection mechanism which is based on searching for the highest frequency bin whose spectral amplitude exceeds a certain noise threshold. The method is based on a theoretical noise amplitude distribution in the video spectral domain. In particular, the method uses a precise model of the statistical distribution of the video spectral power of white noise to establish a threshold for maximum frequency detection. Input to the noise model is the average white noise level in the video spectral display, which can be computed using either of two analytical methods.