The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 1999

Filed:

Dec. 16, 1996
Applicant:
Inventors:

Shigeru Makita, Kyoto, JP;

Yoshihiko Sano, Kyoto, JP;

Hiroyuki Ota, Kyoto, JP;

Yasushi Nakamura, Irvine, CA (US);

Assignee:

Omron Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600200 ; 600121 ; 600186 ; 600203 ;
Abstract

A sensor probe cover (20) is composed of two substantially square transparent films (21) and (22) and a ring (23) having a hole (23a) suitable for being mated with a sensor probe (12). The center of the first film (21) is provided with a hole (21a), and the ring (23) is fused to the inner periphery of the hole (21a) on the inner surface of the first film (21). The ring (23) is made of a material harder than that of the films. The first film (21) and the second film (22) are thermally fused together at the four corners of these films. The thermally fused locations are indicated at (20a). When used in the cover of the probe of an infrared thermometer, the second film (22) is made of a material transparent to infrared radiation. When the tip of the probe (12) is pressed into the ring (23) from above the second film (22), the probe (12) is covered while the second film (22) is folded back. The fitting on of the cover is completed when the ring (23) fits into an annular groove (12a) of the probe (12).


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