The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 1999
Filed:
Aug. 28, 1997
Kazunori Matsumoto, Saitama, JP;
Kazuo Hashimoto, Saitama, JP;
Kokusai Denshin Denwa Co., Ltd, Tokyo, JP;
Abstract
A causality detection apparatus for detecting causality of events based upon a database provided with log of the events includes a sorter module for generating an event list by sorting in time sequence the events, and a frequency analysis module for calculating, based upon the event list, the number of appearance of an event set pair <X,Y> of a first event set X(={e.sub.x1,e.sub.x2, . . . ,e.sub.xn, . . . }, e.sub.xn indicates an event and n is a natural number) and a second event set Y(={e.sub.y1,e.sub.y2, . . . ,e.sub.yn, . . . }, e.sub.yn indicates an event), the number of appearance of the first event set X and the number of appearance of the second event set Y. The event set pair <X,Y> has co-occurrence so that the second event set Y occurs within a predetermined time period (window size W) after a time of occurrence of the first event set X. The apparatus further includes a causality detection module for detecting, based upon the number of appearance of the event set pair <X,Y>, upon the number of appearance of the first event set X and upon the number of appearance of the second event set Y, significance of causality caused by the first event set X to occur the second event set Y within the window size W.