The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 1999

Filed:

Feb. 07, 1997
Applicant:
Inventors:

Pierre Grangeat, Saint Ismier, FR;

Regis Guillemaud, Grenoble, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382131 ; 382276 ; 2503631 ;
Abstract

Apparatus and process for obtaining three-dimensional images of an object by a planar array of detectors, whose focusing points are located on a circle. The advantage obtained is a wider detection field that in the case of focusing on a single point. Rules are given for using algorithms for inverting characteristic measurements of the conical focusing. Application to medicine and to non-destructive testing in industry.


Find Patent Forward Citations

Loading…