The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 1999

Filed:

Dec. 16, 1996
Applicant:
Inventors:

Vladimir A Manasson, Los Angeles, CA (US);

Lev S Sadovnik, Irvine, CA (US);

Assignee:

WaveBand Corporation, Torrance, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q / ; H01Q / ; H01Q / ;
U.S. Cl.
CPC ...
343788 ; 343785 ; 343776 ; 343772 ; 3437 / ;
Abstract

Systems and methods for two dimensional millimeter wave imaging are described. A system includes a spindle assembly defining a rotation axis; a waveguide assembly connected to the spindle assembly, the waveguide assembly including a first dielectric waveguide defining a first axis; and a grating assembly connected to the spindle assembly, the grating assembly including a plurality of sectors, each of the plurality of sectors including a varying period conductive grating pattern. A varying period of the varying period conductive grating pattern is a function of an angle defined by a rotational position of the grating assembly with regard to the rotation axis. The systems and methods provide advantages in that an image can be scanned quickly using an inexpensive system.


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