The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 1999

Filed:

Nov. 06, 1996
Applicant:
Inventors:

Shuji Nakagawa, Tokyo, JP;

Akihiro Kitahara, Tokyo, JP;

Asao Uenodai, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
2502013 ; 250234 ; 359389 ; 359393 ;
Abstract

A microscope includes a light source, an objective lens for converging light emitted from the light source onto a sample, and an optical detector for detecting either light from the sample via a confocal point diaphragm or light from the sample which does not pass through the confocal point diaphragm. A range of a focusing point is detected in accordance with the light which does not pass through the confocal diaphragm, and the focusing point is then detected in accordance with the light detected via the confocal point diaphragm in the detected range of the focusing point.


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