The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 1999

Filed:

Oct. 25, 1995
Applicant:
Inventor:

Raoul Mallart, Paris, FR;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73641 ; 73628 ;
Abstract

A device for the non-destructive testing of hollow tubular objects using ultrasound. The device has a stage for transmission of ultrasonic waves and a stage for reception of ultrasonic signals. The transducer structure includes an assembly of annular individual transducers which are juxtaposed in a coaxial fashion or, in an alternative embodiment, two annular arrays, each of which consists of an assembly of juxtaposed individual transducers. Moreover, the stages for the transmission and reception can simultaneously select, from the assembly or from each of the assemblies, at least one transmitter transducer (2(I)) and at least one receiver transducer (2(j)). This selection forms a transducer sub-assembly which can be displaced at will by electronic scanning along the axis of the succession of transducers in order to enable optimum execution of the so-called TOFD testing method.


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