The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 1999
Filed:
Apr. 09, 1997
Steven D Swift, Seattle, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
A front-end architecture is provided for a measurement instrument having a single path for the input signal for conversion into digital samples. A signal conditioner may be coupled via a pair of test leads across a voltage source, current source, or component to develop an input signal. The input signal is provided to a sampling system, which comprises a sigma-delta converter followed by a decimation filter, which over-samples the input signal to produce a continuous stream of digital samples. The digital samples are provided to a set of digital extraction filters, each digital extraction filter having a structure and transfer function adapted for extracting a measurement parameter from the stream of digital samples. Parameter extraction is performed on a continuous basis so that the digital samples and the resulting digital measurement values arrive in a continuous stream. Extracted parameters include the d.c. value of the input signal, the rms value of the input signal, the waveform parameters of the input signal, and the peak min/max values of the input signal.