The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 1999
Filed:
Dec. 03, 1998
Applicant:
Inventor:
Atsushi Momose, Hatoyama-Machi, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H / ;
U.S. Cl.
CPC ...
378 36 ; 378 37 ;
Abstract
A phase-contrast X-ray imaging system according to the present invention comprises an X-ray interferometer, wherein X-ray interfering beams thicker than 2 cm.times.2 cm are formed enabling observation of comparatively large objects. The X-ray interferometer is constituted by two crystal blocks which each are monolithically cut out from ingots of crystal and have two wafers which function as X-ray half mirrors. An optical equipment, a chamber, and a feedback system are incorporated to adjust and stabilize the crystal blocks. A device is also incorporated to obtain an image showing the distribution of the X-ray phase shift with which diagnosis become easier and reliable.