The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 1999
Filed:
Aug. 26, 1997
Joseph B Slater, Ypsilanti, MI (US);
Michael J Pelletier, Saline, MI (US);
Kaiser Optical Systems, Inc., Ann Arbor, MI (US);
Abstract
Methods and apparatus for synchronous spectral line imaging are disclosed for use in conjunction with any of a number of radiative analysis techniques such as Raman or fluorescence detection. Light emitted points on a sample are separated into wavelength components and directed onto a two-dimensional image sensor such that the wavelength components impinge along one dimension of the sensor. The other dimension of the sensor is used in conjunction with spatial position relative to the sample, with at least certain of the steps being repeated for the different sample points so as to form the spectral line image. In terms of apparatus, the invention preferably utilizes at least one optical fiber having an input end to receive the light emitted by the sample and an output end to deliver the emitted light to the two-dimensional image sensor. The use of a flexible optical fiber facilitates the movement of the light received from the sample, movement of the received light relative to the sensor, or both. A wavelength-separating optical element such as a diffraction grating is disposed between the output end of the optical fiber and the sensor. The image may represent a straight line on the sample, or it may be curved, intermittent or discontinuous.