The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 27, 1999

Filed:

Nov. 03, 1997
Applicant:
Inventors:

Yuko Iwasaki, Tokyo, JP;

Susumu Takagi, Tokyo, JP;

Hideyuki Norimatsu, Tokyo, JP;

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324126 ; 324 725 ; 324132 ;
Abstract

A contact making and breaking device improves the dielectric absorption property of capacitance between one signal wire brought out from a reed switch and an conductive casing. A low current measurement system using the contact making breaking device greatly shortens the measurement waiting time when low current is measured. The contact making and breaking device includes a reed switch with first and second signal wires brought out from either end, a conductive casing, and an insulating material formed between at least the first signal wire and the conductive casing. A tubular conductor is emplaced in the region in which the insulating material is formed and at least partially encloses the reed switch. The tubular conductor is connected to the first signal wire.


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