The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 1999
Filed:
Oct. 10, 1997
Applicant:
Inventor:
Jinzhi Zhang, Beijing, CN;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B21B / ;
U.S. Cl.
CPC ...
72-91 ; 72-92 ; 72 117 ; 72 118 ;
Abstract
A method to measure strip shape in rolling and a method of using the measuring method to control the same are provided in present invention, which can dramatically simplify the computation during the measurement of strip shape. On the basis of a prior mathematical model, the invention is realized by applying a strip rigidity coefficient q reflecting the features of a piece to be rolled, and a shape rigidity coefficient m reflecting those of a mill, to express heredity coefficient .eta..
Zhang, Jinzhi. (1999). Methods to measure and control strip shape in rolling (U.S. Patent No. 5927117). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5927117
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile