The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 1999

Filed:

Jun. 30, 1997
Applicant:
Inventors:

Edward L Chaney, Efland, NC (US);

Daniel S Fritsch, Chapel Hill, NC (US);

Stephen M Pizer, Chapel Hill, NC (US);

Valen Johnson, Durham, NC (US);

Alyson G Wilson, Las Cruces, NM (US);

Assignees:

The University of North Carolina at Chapel Hill, Chapel Hill, NC (US);

Duke University, Durham, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; G06K / ;
U.S. Cl.
CPC ...
382217 ; 382128 ; 382203 ;
Abstract

Methods, systems, and computer program products are provided for automatic image recognition of standard shapes which include a core-based deformable loci skeletal grid used to define and represent an object via a model template. The template includes deformable segments, the changes of which are measurable against the deformed model corresponding to an object in a subsequent image. Statistical correlation techniques optimize the match to further refine the shape of the subsequent image.


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