The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 1999
Filed:
May. 23, 1997
David E Reed, Westminster, CO (US);
William G Bliss, Thornton, CO (US);
Lisa C Sundell, Westminster, CO (US);
Cirrus Logic, Inc., Fremont, CA (US);
Abstract
A sampled amplitude read channel is disclosed for disk storage systems that employs a remod/demod sequence detector guided by an error syndrome of an error detection code (EDC). The remod/demod sequence detector comprises: a conventional trellis type maximum likelihood sequence detector, such as a Viterbi detector, for detecting a preliminary binary sequence from the channel sample values; a syndrome generator for generating an error syndrome in response to the preliminary binary sequence; a remodulator for remodulating the detected binary sequence into a sequence of estimated ideal sample values; a sample error generator for subtracting the channel samples from the estimated samples to generate a sample error sequence; an error pattern detector for detecting potential error events in the sample error sequence; and an error corrector for correcting the preliminary binary sequence when the error syndrome indicates that an error occurred. In the embodiment disclosed herein, the error syndrome is generated as the parity over a predetermined number of bits. When a parity error occurs, a correction is made corresponding to the most likely error event detected. Guiding the remod/demod sequence detector with an error syndrome avoids miscorrections that may otherwise occur in conventional remod/demod sequence detectors.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile