The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 1999

Filed:

Jan. 05, 1996
Applicant:
Inventors:

Terry Ivan Chappell, Portland, OR (US);

Michael Kevin Ciraula, Round Rock, TX (US);

Max Eduardo De Ycaza, Raleigh, NC (US);

Sang Hoo Dhong, Austin, TX (US);

Rudolf Adriaan Haring, Cortlandt Manor, NY (US);

Talal Kamel Jaber, Austin, TX (US);

Mark Samson Milshtein, Hillsboro, OR (US);

Pho Hoang Nguyen, Round Rock, TX (US);

Edward Seewann, Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 2231 ; 327202 ;
Abstract

A high performance register that can be used as a pipelined register in logic chips that are designed using a pulsed logic methodology is described. The register features minimal setup time, pulse catching and pulse launching. The register circuitry complies with and implements a circuit-level test methodology for pulsed logic that features the ability to inhibit the reset of pulses, to force resets and to operate the circuits in a pseudo static mode. The register also complies with the level sensitive scan design (LSSD) methodology. Also described is a state-holding static master-slave register that complies with a pulsed logic design methodology, the register exhibiting an automatic power reduction feature and a simplified modular register bit design which can easily be adapted to either static domino or pulsed logic. The register is also LSSD compliant. Also described is the means and method for allowing static transmission gate input registers to comply with the static evaluate test mode. The automatic power reduction feature can be extended to downstream logic.


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