The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 1999
Filed:
Mar. 21, 1997
Pieter Bijl, Amersfoort, NL;
Jean Mathieu Valeton, Zeist, NL;
Abstract
Test system for viewing systems, such as CCD cameras, infrared viewers, or binoculars or telescopes, which test system is provided with a test object having various component test objects to be shown to the viewing system, which test object is to be placed at a distance from the viewing system and which is to be tendered displayable with the viewing system for an inspection unit (for example, a test operative), with which inspection unit the quality of the operation of the viewing system can be determined on the basis of said display, the test object comprising component test objects differing in appearance from one another and the test system being suitable for presenting said component test objects simultaneously or one after another to the inspection unit to determine a property of the displayed component test objects.