The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 1999
Filed:
Nov. 05, 1996
Koushi Kawamoto, Nakai-machi, JP;
Shoji Sakamoto, Nakai-machi, JP;
Masao Morita, Nakai-machi, JP;
Kazuto Hayashi, Nakai-machi, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
An overlap judgment device writes job sequence divided by a job sequencing device to map memory constituted at coarser resolution than the resolution of a final generated image. At this time, if an image element where a job sequence number is already written is overwritten, the dependence of the job sequence upon processing order is extracted and if an image element is not overwritten, the independence of the job sequence is extracted. A number allocated to job sequence is written to the map memory, if an image element is overwritten, the number of the preceding job sequence is allocated to the overwritten job sequence and referred to when a final image is generated. To reduce overhead for preprocessing to judge overlap between image elements if an image formation instruction is processed in parallel as much as possible, the map memory is constituted by a plurality of planes different in resolution and overlap is judged by first writing to a plane with lower resolution and rewriting to a plane with higher resolution by one level if an image element is overwritten.