The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 1999

Filed:

Nov. 12, 1997
Applicant:
Inventors:

Kazutaka Suzuki, Hamamatsu, JP;

Teruo Takeshita, Hamamatsu, JP;

Koro Uchiyama, Hamamatsu, JP;

Assignee:

Hamamatsu Photonics K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
2502 / ; 313529 ;
Abstract

The pair of vertical deflection electrode plates 13 in the double sweeping streak camera are supplied with a voltage of a sawtooth wave in synchronization with the input optical beam pulses. The other pair of horizontal deflection electrode plates 14 are supplied with a voltage of a stepped wave in synchronization with the sawtooth wave. The deflection electrode plates 13 and 14 sweep successively-incident photoelectrons. The photoelectrons are then detected at the phosphor screen 16. The phosphor screen 16 is therefore recorded with temporal changes in the spatial pattern of the optical beam pulse as an image of regularly-arranged optical beam patterns. The image analyzing device can easily analyze the image.


Find Patent Forward Citations

Suzuki, Kazutaka. (1999). Optical beam spatial pattern recording device (U.S. Patent No. 5925877). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5925877

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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