The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 1999

Filed:

Jun. 25, 1997
Applicant:
Inventors:

Jurgen Liegel, Oberkochen, DE;

Hartmut Wolf, Oberkochen, DE;

Dieter Quendt, Essingen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
2502013 ; 250216 ; 359380 ;
Abstract

In a microscope with an objective, a variable magnification system and an autofocus arrangement, the autofocus arrangement produces a projection beam path for the projection of an autofocus marking onto an observation object, and an imaging beam path which passes through an objective, for imaging on a detector the autofocus marking projected onto the observation object. The projection beam path and/or the imaging beam path then passes through the variable magnification system outside its optical axis.


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