The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 1999
Filed:
Apr. 08, 1997
Applicant:
Inventor:
Kenichi Aihara, Tokyo, JP;
Assignee:
Sony Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 271 ; 348180 ;
Abstract
A method and apparatus for diagnosing or detecting failures or faults in or between circuits such as signal processing circuits of a video camera system. Predetermined test pattern data may be generated on a first or transmitting side (circuit) and discrimination pattern data having substantially the same data pattern as the test pattern data may be generated on a second or receiving side (circuit) in synchronism with the test pattern data. The test pattern data and the discrimination pattern data may be compared. A failure or faulty spot in or between circuits may be determined in accordance with the results of such comparison.