The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 1999
Filed:
Oct. 09, 1996
Applicant:
Inventors:
Tajana Simunic, Sunnyvale, CA (US);
Naresh U Mehta, Santa Clara, CA (US);
Caleb Crome, Mt. View, CA (US);
Assignee:
Altera Corporation, San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364490 ; 39518306 ; 39518309 ;
Abstract
A method and device for testing and manufacturing integrated circuits such as microprocessors, memories, ASICs, programmable logic, and other types of integrated circuits. A test system is designed to test the relevant integrated circuit. A device under test emulator responds to the test system. If modifications are needed, the test system can be modified, and used to test actual devices.