The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 1999

Filed:

Jun. 04, 1997
Applicant:
Inventors:

Toshiyuki Kawashima, N. Huntingdon, PA (US);

Mie Tomiuka, Tokyo, JP;

Tatsuya Watanabe, Tokyo, JP;

Assignees:

Sony Corporation, Tokyo, JP;

Sony Electronics, Inc., Park Ridge, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348190 ; 348745 ; 348806 ;
Abstract

A system for performing beam convergence in video displays. The system is implemented through one or more convergence sensors, which are exposed to two distinct convergence test patterns. The first test pattern partially overlaps with one or more of the sensors to define a first covered area for each overlapped sensor, the portion of each sensor that is not overlapped defining a first uncovered area. The second test pattern overlaps the entirety of the first uncovered area for each sensor, the portion of each sensor that is not overlapped, therefore being the first covered area for each sensor. The output of the sensors when exposed to the first test pattern and the output of the sensors when exposed to the second test pattern are used to perform beam convergence calculations. The test patterns are selected in such a manner as to reduce the dynamic range requirement for the sensor output A/D converter(s).


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