The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 1999

Filed:

May. 20, 1997
Applicant:
Inventor:

Jun Seok Lee, Seoul, KR;

Assignee:

LG Semicon., Ltd., Chungcheongbuk-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B44C / ;
U.S. Cl.
CPC ...
216 24 ; 216 41 ;
Abstract

A method for correcting defects in a phase shift mask is disclosed. The method includes the steps of: forming an etch stopper layer and a phase shift layer on a substrate in succession; forming light shielding layer patterns on the phase shift layer, the light shielding layer patterns having a plurality of opened regions; defining phase shift regions on selected regions of the phase shift layer in the opened regions; selectively removing the phase shift layer in the phase shift regions to a thickness required for phase shifting; and eliminating a defect by simultaneous further etching the same amount of material from the defective phase shift layer and an adjacent open region. This corrects the defect by converting the defective phase shift region to a non-phase-shift region and converting the adjacent open region into a phase shift region.


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