The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 1999
Filed:
Mar. 18, 1997
David R Sandison, Moriarty, NM (US);
Mark R Platzbecker, Albuquerque, NM (US);
Timothy D Vargo, Albuquerque, NM (US);
Randal R Lockhart, Lorain, OH (US);
Michael R Descour, Tucson, AZ (US);
Rebecca Richards-Kortum, Austin, TX (US);
Sandia Corporation, Albuquerque, NM (US);
Abstract
A multispectral imaging method and apparatus adapted for use in determining material properties, especially properties characteristic of abnormal non-dermal cells. A target is illuminated with a narrow band light beam. The target expresses light in response to the excitation. The expressed light is collected and the target's response at specific response wavelengths to specific excitation wavelengths is measured. From the measured multispectral response the target's properties can be determined. A sealed, remote probe and robust components can be used for cervical imaging