The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 1999
Filed:
Mar. 26, 1998
Jocelyn Faubert, Notre-Dame-de-l'Ile-Perrot, CA;
Vasile Diaconu, Ile Perrot, CA;
Universite de Montreal, Quebec, CA;
Abstract
In the spectroreflectometry oxygenation measuring method and device, a light source produces a light beam having a spectral bandwidth including the wavelengths from 450 nm to 850 nm. A first optical system propagates the light beam from the light source to the fundus of a patient's eye, the light beam being reflected at least in part by the fundus of the patient's eye to produce a reflected light beam. A detector unit detects the spectral content of the reflected light beam and produces a signal indicative of this spectral content. A second optical system propagates an axial central portion of the reflected light beam along a predetermined propagation path from the fundus of the patient's eye to the detector unit. To that effect, the second optical system comprises a mirror defining an angle of 45.degree. with the predetermined propagation path and comprising (a) an axial opening for transmitting to the detector unit only the axial central portion of the reflected light beam, and (b) a light-reflecting surface surrounding the axial opening for deviating the axial peripheral portion of the reflected light beam toward the display system. The detector unit comprises a spectrograph responsive to the axial central portion of the reflected light beam to produce a light spectrum, and an array of detectors for measuring intensities of the light components of different wavelengths of the light spectrum. The light beam from the light source has an intensity substantially equal to daylight.