The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 1999
Filed:
Jan. 23, 1997
Kenji Okajima, Tokyo, JP;
Masanobu Miyashita, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
In a three-dimensional reference image segmenting method and device, a two-dimensional image of a reference object and a shape data of a pattern obtained by transforming the image is stored together with depth data of the reference object in a memory as a reference pattern. On the basis of a local Fourier transform image date of an input image supplied from an image transform unit and the reference data of the reference pattern read out from the memory, a deform amount estimating unit calculates the amount of deform (displacement vector) required to make both the images coincident with each other to a possible extent. An inverse Fourier transform unit generates a deformed reference image by an local inverse Fourier transform based on the displacement vector and the data of the local Fourier transform image data of the reference pattern. On the basis of the deformed reference image thus generated, an image segmentation unit extracts a reference object image from within the input image, and the reference object image thus extracted is outputted from an image output unit.