The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 1999

Filed:

Feb. 14, 1997
Applicant:
Inventor:

Jiro Katto, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382154 ; 382225 ; 382283 ;
Abstract

An object detecting system based on multiple-eye images, comprises an image sharpening unit receiving a plurality of images having substantially the same optical axis and different focus positions, for generating one sharpened image, a focus information and a cluster information, a mask generating unit receiving the focus information for generating a first objection detecting information, a region integrating unit receiving the cluster information for generating an integrated cluster information, a region selecting unit receiving the first objection detecting information and the integrated cluster information for generating a second objection detecting information, and an object extracting unit receiving the sharpened image and the second objection detecting information for extracting an object image from the sharpened image in accordance with the second objection detecting information.


Find Patent Forward Citations

Loading…