The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 1999
Filed:
Sep. 21, 1995
Jurgen Klicker, Hoisdorf, DE;
Basler GmbH, , DE;
Abstract
The invention pertains to a method and a device (60) for carrying out the quality control of an object (10). According to this method, at least a partial region of the object is scanned by means of at least one optical scanning system (40), and the gray scale values of the scanned points are recorded and stored. The gray scale values of at least part of the points are evaluated by an evaluation unit (64). In order to attain a faster display of the object (10), the invention proposes that at least part of the recorded gray scale values are stored in a storage unit (62), that at least one respective point is classified as being possibly defective or flawless based on its gray scale value in a filter unit (63) that is arranged in front of the evaluation unit (64), and that at least the points that were classified as being possibly defective are evaluated by the evaluation unit (64) based on the measured data stored in the storage unit (62).