The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 1999

Filed:

Mar. 21, 1997
Applicant:
Inventors:

Satoru Satake, Tokyo, JP;

Rodney S Baishiki, Belmont, CA (US);

Jeffrey M Moser, Oakland, CA (US);

Assignee:

Satake Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382110 ; 356237 ;
Abstract

Rice and other grains are inspected by a video camera system, and the data are processed to determined grain measurements, whether each grain is broken, and to obtain measures such as the percent broken by weight of a sample of rice. The apparatus takes a sample of grains or a stream of grains, and conveys it into view of a video camera. The grains in the camera's view are illuminated by an illumination system. After the grain images have been acquired by the camera and electronics, the grains are then removed from the camera's viewing area to an output stream or hopper, and uninspected grains may be conveyed into the camera's view to continue the process. The image data is processed to identify individual grains and then to perform measurements on them.


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