The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 1999
Filed:
Jul. 23, 1997
Applicant:
Inventors:
Hiroshi Nishikawa, Tokyo, JP;
Toshiyuki Kase, Tokyo, JP;
Assignee:
Asahi Kogaku Kogyo Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356363 ; 356358 ;
Abstract
A lens inclination adjustment system includes an interferometer unit, an inclination adjusting unit and a data processing unit. The data processing unit compares data of the interference fringes generated by the interferometer with predetermined image data to determine inclination status of the lens. Thereafter, in the adjusting unit, the current inclination status of the lens is detected. The data processing unit then calculates a target position to which the inclination status of the lens should be adjusted, and displays a position indicating the current inclination status and the target position on a screen.