The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 1999
Filed:
Mar. 25, 1997
Yukio Ikezawa, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
A lens meter is provided in which a beam of light from an illumination optical system (20) is made incident upon a lens (40) to be inspected, the light beam which has passed through the lens (40) is then received by a light receiving sensor (33b) through a lens platform (13) disposed on a lens receiving table (11) and a light receiving optical system (30), and the two-dimensional optical characteristics of the lens (40) are measured from a detection result of the light receiving sensor (33b). In the lens meter, the lens platform (13) is formed to have such an area as to guide light coming from the middle of the lens (40) and from a predetermined range around the middle to the light receiving sensor (33b), and projections (13b) are formed for determining a light reception distance (2) from the lens (40) to a relay lens (32) of the light receiving optical system (30).