The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 1999
Filed:
Apr. 14, 1998
Jerry E Cahill, Trumbull, CT (US);
David H Tracy, Norwalk, CT (US);
The Perkin-Elmer Corporation, Norwalk, CT (US);
Abstract
In a gas chromatograph system having a column with a stationary phase and a carrier gas moving through the column to contact the stationary phase, the system being useful for detecting analytes in a sample, a method and apparatus for predicting the retention times for the analytes under various conditions, the method utilizing the steps of: a) detecting the analytes under a number of sets of given conditions; b) calculating values for various parameters characteristic of the system based on a mathematical model that includes a correction to compensate for the permeability of said column to said carrier gas; c) entering into the model the values for the characteristic parameters and at least one further set of conditions; and d) using the model to predict retention times for conditions other than those of step a; the apparatus composed of a data handling system including a model for predicting retention times at a variety of conditions of operation of the system, the model having a first set of inputs including retention times determined during a number of operating condition sets; and a second input representative of the permeability of the column to the carrier gas, the data handling system possessing a prediction mechanism for putting into the model a set of conditions other than those of a) above and for putting in the set of parameters, and for predicting retention times for those conditions other than those of a).