The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 1999
Filed:
Nov. 25, 1997
Ronald James Kadlec, Colorado Springs, CO (US);
Paul Henry Kelley, Boca Raton, FL (US);
Philip Saxton Weilbacher, Coconut Creek, FL (US);
Rodime PLC, Santa Fe, NM (US);
Abstract
In a digital servo control system especially suitable for use in disk drives, a sample integrity tester is provided. Sample measurements, indicating the position of a disk drive's read/write head relative to tracks of information on a recording medium, are subject to error due to noise. The sample integrity tester 2410, 2420, 2430 effectively filters out noise-corrupted measurements and thus prevents clearly erroneous measurements from contaminating calculations performed within the servo controller's control loop. If a measured position signal falls outside a given window (indicating a possible spurious position value has been read), an observer's predicted value is used rather than the spurious value. Using the predicted value allows the loop to operate in a 'freewheel' (open-loop) mode. A preferred implementation of the sample integrity tester involves a coarse window that is static, and a fine window that changes dynamically based on an effort signal.