The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 1999

Filed:

Feb. 09, 1995
Applicant:
Inventors:

Koichi Maruyama, Tokyo, JP;

Masahiro Oono, Tokyo, JP;

Satoru Tachihara, Tokyo, JP;

Masato Noguchi, Tokyo, JP;

Tsuyoshi Ishikawa, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359743 ; 359837 ;
Abstract

A chromatic aberration correcting element that is a simple lens having at least one aspheric surface the radius of curvature of which increases from the optical axis toward the periphery, at least either one of the surfaces being formed as a diffraction lens surface that consists of annular segments in steps that are shifted discretely in a direction in which the lens thickness increases as a function of the distance from the optical axis. Also, a chromatic aberration correcting device having annular segments formed in steps on either a light entrance face or a light exit face or both, the annular segments being composed of planes perpendicular to and concentric with the optical axis.


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