The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 1999
Filed:
Feb. 04, 1998
Stephen W Allison, Knoxville, TN (US);
Michael R Cates, Oak Ridge, TN (US);
William S Key, Knoxville, TN (US);
Alvin J Sanders, Knoxville, TN (US);
Dennis D Earl, Knoxville, TN (US);
The University of Tennesee Research Corporation, Knoxville, TN (US);
Lockheed Martin Energy Research Corporation, Oak Ridge, TN (US);
Abstract
This invention relates to a method and apparatus for making absolute distance or ranging measurements using Fresnel diffraction. The invention employs a source of electromagnetic radiation having a known wavelength or wavelength distribution, which sends a beam of electromagnetic radiation through an object which causes it to be split (hereinafter referred to as a 'beamsplitter'), and then to a target. The beam is reflected from the target onto a screen containing an aperture spaced a known distance from the beamsplitter. The aperture is sized so as to produce a Fresnel diffraction pattern. A portion of the beam travels through the aperture to a detector, spaced a known distance from the screen. The detector detects the central intensity of the beam. The distance from the object which causes the beam to be split to the target can then be calculated based upon the known wavelength, aperture radius, beam intensity, and distance from the detector to the screen. Several apparatus embodiments are disclosed for practicing the method embodiments of the present invention.