The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 1999
Filed:
May. 27, 1997
Gregory Hirsch, Pacifica, CA (US);
Other;
Abstract
A plasma source of soft x-rays provides the illumination for a microfluoroscope. In general, an x-ray relay optic collects part of the diverging plasma radiation and redirects it to a distant plane. At that plane, the fine-grained or grainless fluorescent screen of a microfluoroscope is placed to receive the radiation. A specimen is placed in direct contact with the screen, or in very close proximity, so that its x-ray shadow is projected onto the screen. The screen is very thin and transparent to visible or ultraviolet light so that a high-numerical-aperture optical microscope objective can closely approach and view the screen from the opposite side. The optical microscope views the fluorescent light emitted by the screen, which corresponds to the x-ray absorption shadow of the specimen. In general, a very thin, x-ray transparent vacuum window is used to separate the specimen, fluorescent screen, and microscope from the vacuum of the plasma source. Thin-film filters and/or monochromator devices are used to limit the wavelengths of soft x-rays which reach the fluorescent screen to the desired energy range. The use of the apparatus and process occurs with either a separate instrument or as an add-on feature to a conventional optical microscope.