The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 1999

Filed:

Feb. 28, 1997
Applicant:
Inventor:

Hiroaki Ichikawa, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H / ;
U.S. Cl.
CPC ...
361 92 ; 361 94 ; 361100 ;
Abstract

An abnormality detection and protection circuit is provided in association with a driving circuit for a semiconductor device, for detecting plural types of abnormalities and protecting the device from the abnormalities. The present circuit includes a plurality of abnormality detecting devices for detecting the plural types of abnormalities, respectively, a plurality of abnormality storage circuits each provided for the corresponding abnormality detecting devices for storing occurrence of the corresponding type of abnormality, and an abnormality transmitting circuit that transmits a signal representing the detected type of the abnormality to an overall control system for controlling a plurality of semiconductor devices. The circuit of the invention further includes an operation stopping device for stopping a switching operation of the semiconductor device, which device is immediately operated if the detected abnormality is of a type that requires emergency protection, so as to automatically stop the switching operation of the semiconductor device.


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