The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 1999
Filed:
Dec. 04, 1997
Raymond K DeLong, Palos Verdes Estates, CA (US);
Richard A Hutchin, Calabasas, CA (US);
TRW Inc., Redondo Beach, CA (US);
Abstract
An optical wavefront sensor for measuring phase tilt in two dimensions across the cross section of a beam (14), using only a single lenslet array (26) and a single camera sensor array (28). The rectangular lenslet array (26) is oriented at 45 degrees to first and second orthogonal sets of axes defining multiple points of interest (22') in the beam cross section, such that each lenslet subaperture is centered (at 40) between adjacent points of interest on the first and second axes. The points of interest (22') are locations corresponding to the positions of actuators (22) in an adaptive optics system. The camera sensor array (28) has more cells per unit area than there are subapertures per unit area. Only selected cells are activated, to provide for measurements at the approximate mid-points of lines between adjacent points of interest (22') on the first and second orthogonal axes. Thus the sensor array (28) has enough active cells to effect measurements in both orthogonal directions without interference between the cells used for measurement in the two directions, and without the need for multiple lenslet arrays or sensor arrays.