The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 1999

Filed:

Mar. 06, 1997
Applicant:
Inventors:

Christian Stoller, Kingwood, TX (US);

Urmi DasGupta, Houston, TX (US);

Olivier G Philip, Houston, TX (US);

Nihal I Wijeyesekera, Stafford, TX (US);

Peter D Wraight, Ridgefield, CT (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
2502693 ;
Abstract

An advanced method for determining formation density in an array-detector density tool uses three or more detectors to yield an improved accuracy and precision of the formation density measurement even in the presence of a large standoff between the tool and the formation. A more accurate photoelectric factor is determined through a new single detector algorithm. Use of the information on the photoelectric effect and the density from the three detectors allows the measurement of a photoelectric effect compensated for stand off and the photoelectric factor of the mudcake. The use of the multi-detector density answers allows for a consistency check and therefore a much improved quality control of the density measurement.


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